Verification of ESD safety on full chip level is a major challenge for IC design.Especially phenomena with their origin in the overall product setup are posing a hurdle on the way to ESD safe products.For stress according to the Charged Device Model (CDM), a stumbling stone for a simulation based analysis is the complex current distribution among a huge number of sukrensi.com internal nodes leading to hardly predictable voltage drops inside the circuits.<br><br> This paper describes an methodology for Human Body Model (HBM) simulations with an improved ESD-failure coverage and a novel methodology to replace capacitive nodes within a resistive network by current sources for 30hh bikini CDM simulation.
This enables a highly efficient DC simulation clearly marking CDM relevant design weaknesses allowing for application of this software both during product development and for product verification.